Shenzhen, China

Shenzhen Xpectvision Technology Co., Ltd.

Calculating rank
USPTO Granted Patents = 158

% Expired Patents = 15.2


Forward Citations = 180

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12 inventors (with patents filed for the assignee):

goldMedal Peiyan Cao (151 out of 172 patents)

silverMedal Yurun Liu (139 out of 157 patents)

bronzeMedal Chongshen Song (4 out of 4 patents)

4.  Huabin Cheng (4 out of 4 patents)

5.  Shuai Zhang (3 out of 32 patents)

6.  Guanghui Zhang (3 out of 9 patents)

7.  Lele Wang (3 out of 3 patents)

8.  Rui Ding (2 out of 4 patents)

9.  Zhuoting Ye (2 out of 16 patents)

10.  Huan Yu (2 out of 2 patents)

11.  Zhigang Wang (1 out of 19 patents)

12.  Yu Zhang (1 out of 64 patents)


Core Competencies:
Imaging Systems
Radiation Detectors
X-ray Fluorescence
Noise Handling
Cone Beam Computed Tomography
Semiconductor Detectors
Biological Imaging
Mammography
Dental X-ray
Image Sensors
Automatic Exposure Control
Three-Dimensional Imaging

158 patents:

Company Overview
Shenzhen Xpectvision Technology Co., Ltd. specializes in advanced radiation detection technologies, focusing on imaging systems and radiation detectors. The company is engaged in the development of sophisticated solutions such as X-ray fluorescence, cone beam computed tomography, and semiconductor detectors. With a commitment to enhancing biological imaging and mammography, Xpectvision plays a pivotal role in the medical technology landscape, contributing to improved diagnostic capabilities and patient care in the healthcare sector.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Nov 10 2026

Shenzhen Xpectvision Technology Co., Ltd. USPTO Patent Assignee Logo
158 Patents

#39 in Shenzhen

#210 in China

#5,211 in the World

Shenzhen, CN
Shenzhen, China
Forward Citations = 180

12 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Shenzhen Xpectvision Technology Co., Ltd.. Retrieved from https://idiyas.com/company/shenzhen-xpectvision-technology-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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