The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2025

Filed:

Jul. 01, 2021
Applicant:

Shenzhen Xpectvision Technology Co., Ltd., Shenzhen, CN;

Inventors:

Peiyan Cao, Shenzhen, CN;

Yurun Liu, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); G01N 23/046 (2018.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01T 1/2928 (2013.01); G01N 2223/401 (2013.01);
Abstract

Disclosed herein is system comprising: a radiation source; an image sensor; wherein the image sensor comprises a first radiation detector and a second radiation detector, respectively comprising a planar surface configured to receive radiation from the radiation source; wherein the planar surface of the first radiation detector and the planar surface of the second radiation detector are not parallel; wherein the first radiation detector and the second radiation detector are configured to move to a plurality of positions relative to the radiation source; wherein the image sensor is configured to capture, by using the first radiation detector and the second radiation detector and with the radiation, images of portions of a scene at the positions respectively, and configured to form an image of the scene by stitching the images of the portions; wherein the system is configured to rotate relative to the scene about a third axis.


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