Gloucestershire, United Kingdom

Renishaw Metrology Limited


USPTO Granted Patents = 19

Forward Citations = 269

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21 inventors (with patents filed for the assignee):

goldMedal David R McMurtry (14 out of 193 patents)

silverMedal Peter Kenneth Hellier (4 out of 18 patents)

bronzeMedal Peter Hajdukiewicz (4 out of 12 patents)

4.  David Wilson (3 out of 9 patents)

5.  Graham A Hellen (2 out of 5 patents)

6.  David Allan Wright (2 out of 17 patents)

7.  Clifford W Archer (2 out of 5 patents)

8.  Stephen E Lummes (2 out of 12 patents)

9.  Louis P Gonzalez (2 out of 2 patents)

10.  John C Dabbs (2 out of 2 patents)

11.  Andrew Geoffrey Butter (1 out of 12 patents)

12.  Nicholas A James (1 out of 8 patents)

13.  Peter G Lloyd (1 out of 9 patents)

14.  David G Powley (1 out of 6 patents)

15.  John I Rosser (1 out of 1 patent)


19 patents:

Company Overview
Renishaw Metrology Limited, based in Gloucestershire, specializes in precision measurement and automation technologies. The company develops advanced metrology solutions, including coordinate measuring machines, laser scanning systems, and additive manufacturing technologies. Renishaw's innovations serve various industries, such as aerospace, automotive, and medical devices, enhancing manufacturing processes and ensuring quality control. With a strong focus on research and development, Renishaw continues to push the boundaries of measurement technology globally.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

19 Patents

#1 in Gloucestershire

#928 in United Kingdom

#32,693 in the World

Gloucestershire, GB
Gloucestershire, United Kingdom
Forward Citations = 269

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Renishaw Metrology Limited. Retrieved from https://idiyas.com/company/renishaw-metrology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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