The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 1995

Filed:

Mar. 19, 1993
Applicant:
Inventors:

Andrew G Butter, Bristol, GB;

Adrian C Welsford, Bristol, GB;

David G Powley, Bristol, GB;

David R McMurtry, Wotton-Under-Edge, GB;

Assignee:

Renishaw Metrology Limited, Gloucestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33561 ; 33558 ; 33707 ;
Abstract

An analogue probe has a fixed structure and a stylus supporting member connected to the fixed structure by three serially mounted pairs of leaf springs interconnected by first and second intermediate members. The stylus supporting member supports an elongate stem upon which a cube, which supports three scales, is mounted. Readheads are mounted on the fixed structure, in register with the scales, to transduce movement of the stylus supporting member in three substantially orthogonal directions. The alignment of the scales about the yaw axis (extending in a direction perpendicular to the plane of the scale) determines the alignment of the measuring axes of the probe, while the straightness of the lines of the scales determines the straightness of the axes.


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