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Ratoc Systems Engineering Co., Ltd

USPTO Granted Patents = 1

Forward Citations = 11

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2 inventors (with patents filed for the assignee):

Nobuhito Nango (1 out of 1 patent)

Tomoya Ogawa (1 out of 30 patents)

1 patent: Sort by Forward Citations

1. 6124926 - Defect detecting method and device (2000-09-26),

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USPTO Data Jan 1 1976 - Jan 6 2026

1 Patents

#909 in

#15,549 in Japan

Ratoc Systems Engineering Co., Ltd

Forward Citations = 11

2 inventors:

Nobuhito Nango (1 out of 1 patent)

Tomoya Ogawa (1 out of 30 patents)

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