% Expired Patents = 25.0

Forward Citations = 686

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5 inventors (with patents filed for the assignee):

Andreas F Kotowski (4 out of 46 patents)

Steven Winn Smith (2 out of 25 patents)

James Carver (1 out of 6 patents)

4. Douglas Roy Gillard-Hickman (1 out of 6 patents)

5. Khai M Le (1 out of 10 patents)

4 patents: Sort by Forward Citations

1. 7110493 - X-ray detector system having low Z material panel (2006-09-19),

2. 6839403 - Generation and distribution of annotation overlays of digital X-ray images for security systems (2005-01-04),

3. 6665373 - X-ray imaging system with active detector (2003-12-16),

4. 6542580 - Relocatable X-ray imaging system and method for inspecting vehicles and containers (2003-04-01),

Company Overview

Rapiscan Security Products (USA), Inc. is a leading provider of security screening products and services. Their advanced technology helps organizations secure their facilities and protect their assets. With a focus on innovation and customer satisfaction, Rapiscan is trusted by clients worldwide for their reliable and effective security solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

4 Patents

#19 in Hawthorne, CA

#14,051 in California

#60,641 in US

Hawthorne, CA, United States of America

Rapiscan Security Products (USA), Inc.

Forward Citations = 686

5 inventors:

Andreas F Kotowski (4 out of 46 patents)

Steven Winn Smith (2 out of 25 patents)

James Carver (1 out of 6 patents)

4. Douglas Roy Gillard-Hickman (1 out of 6 patents)

5. Khai M Le (1 out of 10 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Rapiscan Security Products (USA), Inc.. Retrieved from https://idiyas.com/company/rapiscan-security-products-usa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]