The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2003

Filed:

Mar. 12, 2002
Applicant:
Inventors:

Andreas F. Kotowski, Rancho Palos Verdes, CA (US);

Steven W. Smith, Poway, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/304 ;
U.S. Cl.
CPC ...
G01N 2/304 ;
Abstract

The present invention provides for an apparatus and method for use in a system with an x-ray source to produce a pencil beam of x-rays to scan an object and a first detector providing a value representative of the intensity of the x-rays scattered from the object to produce a scattered image having a second detector disposed opposite the first detector to provide a value representative of the intensity of the x-rays passing directly from the x-ray source to the second detector; a processor coupled to the system to receive information specifying a position of the pencil beam of x-rays, the processor also coupled to second detector to produce a shadow image formed of pixels indicating the intensity value measured by the second detector for a plurality of positions of the pencil beam of x-rays; and combining the scattered and shadow image to produce a composite image.


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