Rapiscan, Inc.

Calculating rank

USPTO Granted Patents = 4

% Expired Patents = 100.0

Forward Citations = 355

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6 inventors (with patents filed for the assignee):

Andreas F Kotowski (2 out of 46 patents)

Narayan Dass Taneja (1 out of 41 patents)

James Carver (1 out of 6 patents)

4. Peter Steven Bui (1 out of 42 patents)

5. Kenneth Robert Mann (1 out of 7 patents)

6. Khai M Le (1 out of 10 patents)

4 patents: Sort by Forward Citations

1. 7049814 - Nuclear quadrupole resonance based inspection system using a highly resonant and compact magnetic structure (2006-05-23),

2. 6928141 - Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers (2005-08-09),

3. 6843599 - Self-contained, portable inspection system and method (2005-01-18),

4. 6815790 - Position sensing detector for the detection of light within two dimensions (2004-11-09),

Company Overview

Rapiscan, Inc. is a global leader in security screening technology, providing state-of-the-art systems for threat detection in various industries. With a focus on innovation and customer satisfaction, Rapiscan offers a range of products including X-ray scanners, metal detectors, and explosive trace detection solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

4 Patents

#19 in Hawthorne, CA

#14,063 in California

#60,701 in US

Hawthorne, CA, United States of America

Rapiscan, Inc.

Forward Citations = 355

6 inventors:

Andreas F Kotowski (2 out of 46 patents)

Narayan Dass Taneja (1 out of 41 patents)

James Carver (1 out of 6 patents)

4. Peter Steven Bui (1 out of 42 patents)

5. Kenneth Robert Mann (1 out of 7 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Rapiscan, Inc.. Retrieved from https://idiyas.com/company/rapiscan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]