The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Jan. 05, 2004
Kenneth Robert Mann, Surrey, GB;
Kenneth Robert Mann, Surrey, GB;
Rapiscan, Inc., Hawthorne, CA (US);
Abstract
The present invention is directed toward a magnetic resonance based material detection system that includes a resonator probe which is highly resonant, is cost effective and has a compact magnetic structure with a low cost tuning mechanism and high quality factor (Q). The probe is relatively immune to radio frequency interference and can be used in close proximity to other resonator probes of similar design, complementary sensing equipment, and electromagnetic shielding due to its low external magnetic field. It is preferred that, if the magnetic resonance based detection equipment is used with complementary sensing equipment that uses x-rays, the portion of shielding that intersects the x-ray beam is made of thin material of a conductive nature which retains electromagnetic shielding properties while causing minimal attenuation to x-rays. In one embodiment, the resonator probe is a rectangular-shaped single turn toroid fabricated from copper sheets. The resonator probe also has adjacent walls forming an inspection volume such that materials can be passed through this inspection volume.