Trademarks = 1

Forward Citations = 23

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6 inventors (with patents filed for the assignee):

Peter David Koudelka (7 out of 11 patents)

Lubomir Koudelka (6 out of 11 patents)

Ryan Elliot Eckman (4 out of 4 patents)

4. Eric Karl Lindmark (3 out of 11 patents)

5. Steven M Arnold (2 out of 22 patents)

6. Alan Blair (1 out of 12 patents)

7 patents: Sort by Forward Citations

1. 9007572 - Multifunction solid-state inspection system (2015-04-14),

2. 8705041 - Coaxial interferometer and inspection probe (2014-04-22),

3. 8306760 - Defect detection on optical fiber specimen using 3D surface data (2012-11-06),

4. 7801407 - Optical inspection of optical specimens supported by a work holder (2010-09-21),

5. 7667831 - Method and device for inspecting a surface of an optical component (2010-02-23),

6. 7505652 - Optical inspection of optical specimens supported by a work holder (2009-03-17),

7. 7312859 - Optical fiber inspection device (2007-12-25),

Company Overview

Promet International, Inc. is a leading provider of innovative IT solutions for businesses worldwide. We specialize in delivering custom software development, Drupal web design, and digital marketing services to help our clients achieve their goals. With a team of experienced professionals, we are committed to providing top-notch solutions that drive success and growth for our clients.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

7 Patents

#5 in Shoreview, MN

#1,122 in Minnesota

#39,907 in US

Shoreview, MN, United States of America

Promet International, Inc.

Forward Citations = 23

6 inventors:

Peter David Koudelka (7 out of 11 patents)

Lubomir Koudelka (6 out of 11 patents)

Ryan Elliot Eckman (4 out of 4 patents)

4. Eric Karl Lindmark (3 out of 11 patents)

5. Steven M Arnold (2 out of 22 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Promet International, Inc.. Retrieved from https://idiyas.com/company/promet-international

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]