The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Nov. 09, 2007
Lubomir Koudelka, Shoreview, MN (US);
Steven M. Arnold, Minnetonka, MN (US);
Peter David Koudelka, St. Paul, MN (US);
Ryan Elliot Eckman, Columbus Township, MN (US);
Eric Karl Lindmark, Shoreview, MN (US);
Lubomir Koudelka, Shoreview, MN (US);
Steven M. Arnold, Minnetonka, MN (US);
Peter David Koudelka, St. Paul, MN (US);
Ryan Elliot Eckman, Columbus Township, MN (US);
Eric Karl Lindmark, Shoreview, MN (US);
PROMET International, Inc., Shoreview, MN (US);
Abstract
The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed in the main body. The optical imaging system includes imaging components for acquiring a microscope visual image and for acquiring at least one interference fringe image of the surface of the optical specimen. The optical testing device also includes a translational mechanism housed in the main body and configured to allow linear movement of the optical imaging system and to prevent off-axis movement of the optical imaging system.