Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
12 Patents
#167 in Los Angeles, CA
#6,066 in California
#25,578 in US
#48,209 in the World
Pressure Profile Systems Corporation
Forward Citations = 486
11 inventors:
Los Angeles, CA, United States of America
Pressure Profile Systems Corporation
% Expired Patents = 50.0
Forward Citations = 486
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11 inventors (with patents filed for the assignee):
Jae S Son (11 out of 20 patents)
Thomas R Parks (2 out of 13 patents)
Robert Howe (1 out of 10 patents)
4. Parris S Wellman (1 out of 19 patents)
5. Yerko Alfonso (1 out of 1 patent)
6. David Ables (1 out of 1 patent)
7. Gordon Dobie (1 out of 1 patent)
8. Tom Parks (1 out of 1 patent)
9. William Peine (1 out of 1 patent)
10. Robert Pratico (1 out of 1 patent)
11. Sang Youl Han (1 out of 1 patent)
12 patents:
Company Overview
Pressure Profile Systems Corporation, based in Los Angeles, CA, specializes in advanced pressure measurement technologies. The company develops innovative solutions for various industries, focusing on enhancing the accuracy and efficiency of pressure data collection and analysis. Their expertise spans multiple domains, including oil and gas, aerospace, and industrial applications, where precise pressure monitoring is critical for operational success. By leveraging cutting-edge technology, Pressure Profile Systems aims to improve safety and performance in complex environments.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Pressure Profile Systems Corporation. Retrieved from https://idiyas.com/company/pressure-profile-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]