The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

Jan. 12, 2009
Applicant:

Thomas R. Parks, Hermosa Beach, CA (US);

Inventor:

Thomas R. Parks, Hermosa Beach, CA (US);

Assignee:

Pressure Profile Systems, Inc., Los Angles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); A61B 5/117 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for visually indicating, in real time or post hoc, values of a physical property detected over a period of time along a dimension of an organism to a user on a temporal plot and a profile plot, either individually or concurrently. The detected values may be visually indicated on the temporal plot using any of a variety of techniques, including, but not limited to, a contour technique, a line trace technique or a mesh plot technique. Further, the detected values may be visually indicated on the profile plot using any of a variety of techniques, including, but not limited to a contour technique, a line trace technique or a histogram technique. To provide a finer spatial resolution, values may be interpolated for locations between the locations at which values were detected, and these values may be displayed on the temporal plot and the profile plot.


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