Hawthorne, NY, United States of America

Packaging Technologies & Inspection, LLC


USPTO Granted Patents = 16


Trademarks = 3

Forward Citations = 51

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14 inventors (with patents filed for the assignee):

goldMedal Anton Stauffer (9 out of 9 patents)

silverMedal Oliver Stauffer (7 out of 7 patents)

bronzeMedal Heinz Wolf (6 out of 7 patents)

4.  Mikhail Kneller (4 out of 5 patents)

5.  Andrew William O'Sullivan (3 out of 4 patents)

6.  Ross Treloar (3 out of 3 patents)

7.  Undrakh Bekhtur (2 out of 2 patents)

8.  Charles Stauffer (2 out of 2 patents)

9.  Sandipan Saha (1 out of 1 patent)

10.  Conroy Brown (1 out of 1 patent)

11.  Mikhail Knellar (1 out of 1 patent)

12.  Ian Andrew Neeson (1 out of 2 patents)

13.  Quentin Talon (1 out of 1 patent)

14.  Guerney Hunt (1 out of 1 patent)

15.  Dana Guazzo (1 patent)


16 patents:

Company Overview
Packaging Technologies & Inspection, LLC specializes in advanced packaging solutions and inspection technologies. Based in Hawthorne, NY, the company focuses on providing innovative systems for quality assurance in packaging processes, particularly in the food and pharmaceutical sectors. Their expertise encompasses a range of technologies aimed at enhancing product safety and compliance, ensuring that packaged goods meet stringent industry standards. PTI is committed to delivering reliable solutions that improve operational efficiency and product integrity.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

Packaging Technologies & Inspection, LLC USPTO Patent Assignee Logo
16 Patents

#3 in Hawthorne, NY

#1,158 in New York

#19,907 in US

#37,788 in the World

Hawthorne, NY (US)
Hawthorne, NY, United States of America
Forward Citations = 51

14 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Packaging Technologies & Inspection, LLC. Retrieved from https://idiyas.com/company/packaging-technologies-and-inspection

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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