The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Aug. 10, 2018
Packaging Technologies & Inspection, Llc, Hawthorne, NY (US);
Mikhail Kneller, Bronx, NY (US);
Conroy Brown, Bronx, NY (US);
Anton Stauffer, Morges, CH;
Oliver Stauffer, Tuckahoe, NY (US);
PACKAGING TECHNOLOGIES AND INSPECTION, LLC, Hawthorne, NY (US);
Abstract
The current invention mitigates the problem of incorrect determinations of leaking packages during vacuum decay leak detection testing. As described in this disclosure, a testing chamber used for vacuum decay leak detection testing is exposed to interferences when not under vacuum or at low pressure conditions between testing cycles. By measuring one or more exposure time intervals immediately preceding a present test cycle, it is possible to improve detection of leaking packages by adjusting raw measured pressure gathered during vacuum decay leak testing based upon the length of exposure times and create corrected pressure data used to improve vacuum decay leak detection.