Salt Lake City, UT, United States of America

Orbtek, Inc.

Calculating rank

USPTO Granted Patents = 5

Trademarks = 1

Forward Citations = 188

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6 inventors (with patents filed for the assignee):

Edwin Jay Sarver (3 out of 45 patents)

Charles R Broadus (3 out of 13 patents)

Richard K Snook (2 out of 5 patents)

4. Gregg D Niven (1 out of 26 patents)

5. Timothy N Turner (1 out of 13 patents)

6. Joseph R Bentley (1 out of 5 patents)

5 patents: Sort by Forward Citations

1. 6120150 - Device and method for mapping the topography of an eye using elevation (2000-09-19),

2. 6079831 - Device and method for mapping the topography of an eye using elevation (2000-06-27),

3. 5864383 - Single-curvature placido plate (1999-01-26),

4. 5512966 - Ophthalmic pachymeter and method of making ophthalmic determinations (1996-04-30),

5. 5512965 - Ophthalmic instrument and method of making ophthalmic determinations (1996-04-30),

Company Overview

Orbtek, Inc. is a leading technology company specializing in the development of innovative solutions for the aerospace and defense industries. With a focus on cutting-edge research and development, Orbtek delivers high-quality products and services to its clients around the world. Their team of experts is dedicated to pushing the boundaries of technology to create solutions that meet the evolving needs of their customers.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

5 Patents

#249 in Salt Lake City, UT

#670 in Utah

#51,669 in US

Salt Lake City, UT, United States of America

Orbtek, Inc.

Forward Citations = 188

6 inventors:

Edwin Jay Sarver (3 out of 45 patents)

Charles R Broadus (3 out of 13 patents)

Richard K Snook (2 out of 5 patents)

4. Gregg D Niven (1 out of 26 patents)

5. Timothy N Turner (1 out of 13 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Orbtek, Inc.. Retrieved from https://idiyas.com/company/orbtek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]