Optec Co., Ltd.

Calculating rank

USPTO Granted Patents = 8

Forward Citations = 171

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4 inventors (with patents filed for the assignee):

Tadashi Suzuki (3 out of 123 patents)

Toyohisa Hiroki (3 out of 6 patents)

Yoshinori Narutaki (3 out of 3 patents)

4. Yutaka Nakanishi (2 out of 23 patents)

8 patents: Sort by Forward Citations

1. 6181741 - Remote control receiver (2001-01-30),

2. 5837182 - Method of molding synthetic resin screws (1998-11-17),

3. 5759100 - Game machine controller (1998-06-02),

4. 5700415 - Method of molding synthetic resin and apparatus for use therein (1997-12-23),

5. 5595702 - Method of and apparatus for molding synthetic resin screws (1997-01-21),

6. 5208642 - Electro-optical distance meter (1993-05-04),

7. 5087125 - Equipment for measuring a difference in elevation (1992-02-11),

8. 4733069 - Position encoder using a laser scan beam (1988-03-22),

Company Overview

Optec Co., Ltd. is a leading provider of optical measurement solutions for various industries including aerospace, automotive, and medical. With over 30 years of experience, Optec offers a wide range of products and services such as optical sensors, inspection systems, and custom solutions to meet the specific needs of its customers. Their advanced technologies and commitment to quality make them a trusted partner for precision measurement applications.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

8 Patents

#86 in Saitama 343-0827

#5,050 in Japan

Saitama, Japan

Optec Co., Ltd.

Forward Citations = 171

4 inventors:

Tadashi Suzuki (3 out of 123 patents)

Toyohisa Hiroki (3 out of 6 patents)

Yoshinori Narutaki (3 out of 3 patents)

4. Yutaka Nakanishi (2 out of 23 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Optec Co., Ltd.. Retrieved from https://idiyas.com/company/optec-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]