Opsis Ab

Calculating rank

USPTO Granted Patents = 6

EPO Patents = 2

Trademarks = 3

Forward Citations = 53

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3 inventors (with patents filed for the assignee):

Svante Wallin (5 out of 5 patents)

Leif Uneus (4 out of 4 patents)

Kaj Larsson (1 out of 2 patents)

6 patents: Sort by Forward Citations

1. 11802832 - Method and system for determining a content of HS (2023-10-31),

2. 8610066 - Device for radiation absorption measurements and method for calibration thereof (2013-12-17),

3. 5650848 - Interferometer compensation for displacement inaccuracies during path (1997-07-22),

4. 5517314 - Optical analysing equipment for determining parameters of gaseous (1996-05-14),

5. 5255073 - Apparatus for emitting and receiving light (1993-10-19),

6. 4790652 - Method and apparatus for determining parameters of gaseous substances (1988-12-13),

Company Overview

Opsis is a leading company in the environmental monitoring industry, specializing in air quality monitoring solutions. With over 30 years of experience, Opsis provides comprehensive and reliable monitoring systems that help industries and governments around the world to monitor and manage their environmental impact. Opsis' products range from ambient air quality monitoring systems to process control solutions, enabling detailed and accurate measurements of various pollutants. With a strong focus on innovation and customer satisfaction, Opsis is dedicated to creating sustainable and effective solutions for a cleaner and healthier environment.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

6 Patents

#1 in Furulund

#931 in Sweden

Furulund, Sweden

Opsis Ab

Forward Citations = 53

3 inventors:

Svante Wallin (5 out of 5 patents)

Leif Uneus (4 out of 4 patents)

Kaj Larsson (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Opsis Ab. Retrieved from https://idiyas.com/company/opsis-ab

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]