Veldhoven, Netherlands

O.d.m.e. International B.v.

USPTO Granted Patents = 11

% Expired Patents = 9.1

Forward Citations = 58

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22 inventors (with patents filed for the assignee):

goldMedal Jeroen Fm Landsbergen (2 out of 3 patents)

silverMedal Jan Visser (2 out of 3 patents)

bronzeMedal Ronaldus J Kok (2 out of 3 patents)

4.  Ove Öhman (1 out of 6 patents)

5.  Jean Ledieu (1 out of 7 patents)

6.  Lars Bering (1 out of 2 patents)

7.  Thomas Wilhelmus Engelen (1 out of 1 patent)

8.  Walter T M Stals (1 out of 1 patent)

9.  Jacobus J T T Vermeijlen (1 out of 1 patent)

10.  Roland Anthony Tacken (1 out of 1 patent)

11.  Alex Thomas Van Der Plaat (1 out of 1 patent)

12.  Maria Elizabeth Reuhman-Huisken (1 out of 1 patent)

13.  Jacob De Boer (1 out of 1 patent)

14.  Petrus J Goudsmits (1 out of 1 patent)

15.  Martin Hamming (1 out of 1 patent)


11 patents:

Company Overview
O.d.m.e. International B.V., based in Veldhoven, Netherlands, specializes in the development and manufacturing of advanced electronic systems and components. The company focuses on providing innovative solutions for various industries, including telecommunications and automotive sectors. With a commitment to research and development, O.d.m.e. International leverages cutting-edge technology to enhance product performance and reliability, catering to a global market while maintaining a strong emphasis on quality and customer satisfaction.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

11 Patents

#10 in Veldhoven

#569 in Netherlands

#51,801 in the World

Veldhoven, NL
Veldhoven, Netherlands
Forward Citations = 58

22 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: O.d.m.e. International B.v.. Retrieved from https://idiyas.com/company/o-d-m-e-international-b-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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