Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
5 Patents
#36 in Melville, NY
#3,133 in New York
#51,644 in US
Ntd Laboratories, Inc.
Forward Citations = 191
8 inventors:
Melville, NY, United States of America
Ntd Laboratories, Inc.
% Expired Patents = 80.0
EPO Patents = 1
Forward Citations = 191
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8 inventors (with patents filed for the assignee):
David A Krantz (4 out of 4 patents)
Francesco Orlandi (4 out of 4 patents)
Vincent James Macri (1 out of 12 patents)
4. Keld Sorensen (1 out of 1 patent)
5. Timothy J Douros (1 out of 1 patent)
6. James N Macri (1 out of 10 patents)
7. Paul Sajda (1 out of 1 patent)
8. Emiddio V Ippolito (1 out of 1 patent)
9. Pertti Hurskainen (6 patents)
10. Tarja Ahola (5 patents)
11. Teemu Korpimäki (11 patents)
12. Mark Norman Bobrow (30 patents)
13. Heini Frang (0 patent)
14. Jonathan B Carmichael (0 patent)
5 patents:
1. 7780600 - System and method for utilizing shape analysis to assess fetal abnormality (2010-08-24),
Company Overview
Ntd Laboratories, Inc. is a leading provider of clinical laboratory testing services, specializing in molecular diagnostics and genetic testing. With state-of-the-art facilities and a team of experienced professionals, we offer accurate and reliable results for healthcare providers and patients. Our services cover a wide range of testing areas, including infectious diseases, oncology, and pharmacogenomics. Visit our website to learn more about our comprehensive testing solutions.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ntd Laboratories, Inc.. Retrieved from https://idiyas.com/company/ntd-laboratories
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]