The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Mar. 25, 2004
Applicants:
David A. Krantz, Bayside, NY (US);
Francesco Orlandi, Palermo, IT;
Inventors:
David A. Krantz, Bayside, NY (US);
Francesco Orlandi, Palermo, IT;
Assignee:
NTD Laboratories, Inc., Huntington Station, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for utilizing shape analysis to assess fetal abnormality. According to one embodiment, coordinates of points identifying a shape in a fetal image are received, coefficients of one or more mathematical functions that describe the identified shape are determined, and the determined coefficients are utilized as markers to assess fetal abnormality.
Krantz, David. (2007). System and method for utilizing shape analysis to assess fetal abnormality (U.S. Patent No. 7244233). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7244233
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile