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Charleroi, PA, United States of America

Nokomis, Inc.

USPTO Granted Patents = 58

EPO Patents = 4

Trademarks = 1

Forward Citations = 431

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21 inventors (with patents filed for the assignee):

Walter J Keller, Iii (24 out of 25 patents)

Walter John Keller (22 out of 22 patents)

Todd Eric Chornenky (17 out of 22 patents)

4. Andrew Richard Portune (11 out of 12 patents)

5. James Robert Uplinger, Ii (9 out of 10 patents)

6. Stephen Dorn Freeman (6 out of 9 patents)

7. Bogdan Amaru Pathak (6 out of 6 patents)

8. William Anthony Davis (5 out of 5 patents)

9. Vladimir Makarenko (4 out of 4 patents)

10. Jennting Timothy Hsu (4 out of 4 patents)

11. Robert Michael Nichol (4 out of 4 patents)

12. Patrick Fisher (3 out of 17 patents)

13. Adam Brant (3 out of 3 patents)

14. Jason Galyardt (3 out of 3 patents)

15. Karen Heike Spieler Canne (3 out of 3 patents)

Core Competencies:

Microelectronics Testing

Counterfeit Detection

RF Emissions

Medical Device Diagnostics

Electromagnetic Analysis

Gas Concentration Measurement

Advanced Manufacturing

Cyber Physical Security

Acoustic Sources Detection

Tissue Damage Assessment

Integrated Circuits

Electronics Equipment Testing

58 patents: Sort by Forward Citations

1. 12638499 - Testing of microelectronics device and method (2026-05-26),

2. 12445461 - System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network (2025-10-14),

3. 12379329 - RF rapid diagnostics of infection and contamination (2025-08-05),

4. 12117476 - Method and apparatus for detection and identification of counterfeit and substandard electronics (2024-10-15),

5. 12068544 - Electrical device condition determining sensor and method (2024-08-20),

6. 12050242 - Health assessment of vehicles using unintended emissions (2024-07-30),

7. 12040531 - Electronics card insitu testing apparatus and method utilizing unintended RF emission features (2024-07-16),

8. 11936766 - Direct conversion receiver using coherent integration (2024-03-19),

9. 11908811 - System and method for physically detecting counterfeit electronics (2024-02-20),

10. 11879935 - Testing of microelectronics device and method (2024-01-23),

11. 11769045 - Method to identify acoustic sources for anti-submarine warfare (2023-09-26),

12. 11733283 - Method and apparatus for detection and identification of counterfeit and substandard electronics (2023-08-22),

13. 11489847 - System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network (2022-11-01),

14. 11483123 - Direct conversion receiver using coherent integration (2022-10-25),

15. 11463231 - Synchronized multi-channel communication device and method (2022-10-04),

Company Overview

Nokomis, Inc., based in Charleroi, PA, specializes in electronics diagnostics, focusing on advanced technologies for microelectronics testing and counterfeit detection. The company is recognized for its expertise in RF emissions, medical device diagnostics, and electromagnetic analysis, contributing to enhanced safety and reliability in various applications. Additionally, Nokomis is involved in gas concentration measurement and advanced manufacturing, emphasizing cyber-physical security to protect critical systems and data integrity.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

58 Patents

#1 in Charleroi, PA

#234 in Pennsylvania

#6,151 in US

#12,380 in the World

Charleroi, PA, United States of America

Nokomis, Inc.

Forward Citations = 431

21 inventors:

Walter J Keller, Iii (24 out of 25 patents)

Walter John Keller (22 out of 22 patents)

Todd Eric Chornenky (17 out of 22 patents)

4. Andrew Richard Portune (11 out of 12 patents)

5. James Robert Uplinger, Ii (9 out of 10 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nokomis, Inc.. Retrieved from https://idiyas.com/company/nokomis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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