The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2024

Filed:

Sep. 25, 2020
Applicant:

Nokomis, Inc., Canonsburg, PA (US);

Inventors:

Todd Eric Chornenky, Carmichaels, PA (US);

James Robert Uplinger, II, Cranberry Township, PA (US);

Andrew Richard Portune, Oakdale, PA (US);

Walter J Keller, III, Bridgeville, PA (US);

Assignee:

NOKOMIS, INC., Canonsburg, PA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/312 (2006.01);
U.S. Cl.
CPC ...
G01R 31/312 (2013.01);
Abstract

A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture within a shielded enclosure by analysis of emission metrics. The testing fixture can include a first layer with a capacitive member and a second layer with a cavity to receive a microelectronic part. A filter in a transmission chain can pass a high power signal to the fixture. A filter in a receving chain can pass a low power signal to the analysis unit.


Find Patent Forward Citations

Loading…