Forward Citations = 122

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7 inventors (with patents filed for the assignee):

Richard A Goldbach (5 out of 13 patents)

William A Wagner (3 out of 4 patents)

Frank E McConnell (2 out of 7 patents)

4. Joseph Wayne Kuchta (1 out of 2 patents)

5. Joseph H Hoffman (1 out of 1 patent)

6. Richard C Goldbach (1 out of 1 patent)

7. John R Salzer (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 5807168 - Self-contained device for cleaning and coating hold surfaces in a bulk (1998-09-15),

2. 5540172 - Apparatus for performing external surface work on underside of ship hull (1996-07-30),

3. 5398632 - Apparatus and method for performing external surface work on ship hulls (1995-03-21),

4. 5355823 - Apparatus and method for performing external surface work on ships' hulls (1994-10-18),

5. 5353729 - Apparatus and method for performing external surface work on ship hulls (1994-10-11),

Company Overview

MMC Compliance Engineering, Inc. is a leading provider of compliance engineering services for various industries. With a team of experienced engineers and consultants, we specialize in ensuring that our clients meet regulatory standards and requirements. Our services include EMC testing, product safety assessments, and regulatory compliance consulting. We strive to deliver high-quality services to help our clients achieve compliance with confidence.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

5 Patents

#19 in Norfolk, VA

#922 in Virginia

#51,570 in US

Norfolk, VA, United States of America

Mmc Compliance Engineering, Inc.

Forward Citations = 122

7 inventors:

Richard A Goldbach (5 out of 13 patents)

William A Wagner (3 out of 4 patents)

Frank E McConnell (2 out of 7 patents)

4. Joseph Wayne Kuchta (1 out of 2 patents)

5. Joseph H Hoffman (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mmc Compliance Engineering, Inc.. Retrieved from https://idiyas.com/company/mmc-compliance-engineering

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]