For the Inventor, By the Inventor

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Carlsbad, CA, United States of America

Microprobe, Inc.

USPTO Granted Patents = 42

% Expired Patents = 21.4

Forward Citations = 1,659

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21 inventors (with patents filed for the assignee):

January Kister (26 out of 56 patents)

Rich B Meyer, Jr (5 out of 30 patents)

Jeffrey Van Ness (5 out of 35 patents)

4. Dennis E Schwartz (4 out of 8 patents)

5. Nicolaas M Vermeulen (4 out of 8 patents)

6. B Melina Cimler (3 out of 4 patents)

7. Roy H Kanemoto (3 out of 3 patents)

8. Paul M Elizondo, Ii (2 out of 32 patents)

9. Michael W Reed (2 out of 33 patents)

10. Charles R Petrie (2 out of 26 patents)

11. Susan M Watanabe (2 out of 5 patents)

12. Kim Dix (2 out of 2 patents)

13. Nicolaas M Vermuelen (2 out of 2 patents)

14. Welton B Whann (2 out of 2 patents)

15. Alexander A Gall (1 out of 47 patents)

Core Competencies:

Probe Skates

Electrical Testing

Probe Bonding

High Density Probe Card

Vertical Probe Array

Mechanical Scrub

Laser Machining

Current Carrying Capacity

Space Transformers

Self-Cleaning Probes

Oligonucleotide Probes

Diagnostic Assays

42 patents: Sort by Forward Citations

1. RE46221 - Probe skates for electrical testing of convex pad topologies (2016-11-28),

2. 9476911 - Probes with high current carrying capability and laser machining methods (2016-10-25),

3. 9250266 - Probe bonding method having improved control of bonding material (2016-02-02),

4. 8988091 - Multiple contact probes (2015-03-24),

5. 8907689 - Probe retention arrangement (2014-12-09),

6. 8723546 - Vertical guided layered probe (2014-05-13),

7. 8415963 - Low profile probe having improved mechanical scrub and reduced contact inductance (2013-04-09),

8. 8324923 - Vertical probe array arranged to provide space transformation (2012-12-04),

9. 8230593 - Probe bonding method having improved control of bonding material (2012-07-31),

10. RE43503 - Probe skates for electrical testing of convex pad topologies (2012-07-09),

11. 8203353 - Probes with offset arm and suspension structure (2012-06-19),

12. 8111080 - Knee probe having reduced thickness section for control of scrub motion (2012-02-07),

13. 7952377 - Vertical probe array arranged to provide space transformation (2011-05-31),

14. 7944224 - Low profile probe having improved mechanical scrub and reduced contact inductance (2011-05-17),

15. 7759949 - Probes with self-cleaning blunt skates for contacting conductive pads (2010-07-20),

Microprobe, Inc., based in Carlsbad, California, specializes in advanced electrical testing solutions and innovative probe technology. The company focuses on developing high current probes, probe bonding methods, and vertical probe arrays, catering to the needs of semiconductor and microelectronics industries. Their expertise extends to self-cleaning probes and oligonucleotide probes, facilitating nucleic acid hybridization processes. Microprobe's commitment to precision and reliability positions it as a key player in the evolving landscape of electrical testing and probe technology.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

Microprobe, Inc.

42 Patents

#38 in Carlsbad, CA

#1,940 in California

#8,253 in US

#16,338 in the World

Carlsbad, CA, United States of America

Microprobe, Inc.

Forward Citations = 1,659

21 inventors:

January Kister (26 out of 56 patents)

Rich B Meyer, Jr (5 out of 30 patents)

Jeffrey Van Ness (5 out of 35 patents)

4. Dennis E Schwartz (4 out of 8 patents)

5. Nicolaas M Vermeulen (4 out of 8 patents)

Please report any incorrect information to [email protected]

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