For the Inventor, By the Inventor

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Carlsbad, CA, United States of America

Microprobe, Inc.

USPTO Granted Patents = 42

% Expired Patents = 21.4

Forward Citations = 1,659

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21 inventors (with patents filed for the assignee):

January Kister (26 out of 56 patents)

Rich B Meyer, Jr (5 out of 30 patents)

Jeffrey Van Ness (5 out of 35 patents)

4. Dennis E Schwartz (4 out of 8 patents)

5. Nicolaas M Vermeulen (4 out of 8 patents)

6. B Melina Cimler (3 out of 4 patents)

7. Roy H Kanemoto (3 out of 3 patents)

8. Paul M Elizondo, Ii (2 out of 32 patents)

9. Michael W Reed (2 out of 33 patents)

10. Charles R Petrie (2 out of 26 patents)

11. Susan M Watanabe (2 out of 5 patents)

12. Kim Dix (2 out of 2 patents)

13. Nicolaas M Vermuelen (2 out of 2 patents)

14. Welton B Whann (2 out of 2 patents)

15. Alexander A Gall (1 out of 47 patents)

Core Competencies:

Electrical Testing

Probe Technology

High Current Probes

Probe Bonding Methods

Vertical Probe Arrays

Self-Cleaning Probes

Oligonucleotide Probes

Nucleic Acid Hybridization

Diagnostic Assays

Mechanical Scrub Control

Space Transformers

Robotic Machines

42 patents: Sort by Forward Citations

1. RE46221 - Probe skates for electrical testing of convex pad topologies (2016-11-28),

2. 9476911 - Probes with high current carrying capability and laser machining methods (2016-10-25),

3. 9250266 - Probe bonding method having improved control of bonding material (2016-02-02),

4. 8988091 - Multiple contact probes (2015-03-24),

5. 8907689 - Probe retention arrangement (2014-12-09),

6. 8723546 - Vertical guided layered probe (2014-05-13),

7. 8415963 - Low profile probe having improved mechanical scrub and reduced contact inductance (2013-04-09),

8. 8324923 - Vertical probe array arranged to provide space transformation (2012-12-04),

9. 8230593 - Probe bonding method having improved control of bonding material (2012-07-31),

10. RE43503 - Probe skates for electrical testing of convex pad topologies (2012-07-09),

11. 8203353 - Probes with offset arm and suspension structure (2012-06-19),

12. 8111080 - Knee probe having reduced thickness section for control of scrub motion (2012-02-07),

13. 7952377 - Vertical probe array arranged to provide space transformation (2011-05-31),

14. 7944224 - Low profile probe having improved mechanical scrub and reduced contact inductance (2011-05-17),

15. 7759949 - Probes with self-cleaning blunt skates for contacting conductive pads (2010-07-20),

Microprobe, Inc. specializes in manufacturing advanced electronic components and systems for various industries. With over 30 years of experience, we design, develop, and produce high-quality microprobes, sensors, and analytical instruments. Our cutting-edge technology solutions cater to applications in medical, semiconductor, aerospace, and automotive fields. Our commitment to innovation and customer satisfaction has made us a trusted partner for companies worldwide.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

Microprobe, Inc.

42 Patents

#38 in Carlsbad, CA

#1,935 in California

#8,240 in US

#16,304 in the World

Carlsbad, CA, United States of America

Microprobe, Inc.

Forward Citations = 1,659

21 inventors:

January Kister (26 out of 56 patents)

Rich B Meyer, Jr (5 out of 30 patents)

Jeffrey Van Ness (5 out of 35 patents)

4. Dennis E Schwartz (4 out of 8 patents)

5. Nicolaas M Vermeulen (4 out of 8 patents)

Please report any incorrect information to [email protected]

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