The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Mar. 02, 2010
Applicant:
January Kister, Portola Valley, CA (US);
Inventor:
January Kister, Portola Valley, CA (US);
Assignee:
MicroProbe, Inc., Carlsbad, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/20 (2006.01); G01R 1/073 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07314 (2013.01); G01R 1/0675 (2013.01); G01R 1/06755 (2013.01);
Abstract
The present invention is a set of layered probes that make electrical contact to a device under test. The layered probes are disposed within openings of at least one guide plate. The guide plate surrounds the probes via the openings. The layered probes have a base end, an opposing tip end and a shaft connecting the base end to the tip end. The base end can have a positioning device that extends away from the base end.