Cupertino, CA, United States of America

Measurex Corporation


USPTO Granted Patents = 147

Forward Citations = 2,740

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93 inventors (with patents filed for the assignee):

goldMedal Mathew G Boissevain (28 out of 29 patents)

silverMedal Lee M Chase (23 out of 43 patents)

bronzeMedal John D Goss (18 out of 35 patents)

4.  Leonard M Anderson (15 out of 15 patents)

5.  John J Howarth (13 out of 13 patents)

6.  Ramesh Balakrishnan (9 out of 12 patents)

7.  Paul J Houghton (8 out of 12 patents)

8.  Michael K Norton (8 out of 8 patents)

9.  John A Dahlquist (7 out of 10 patents)

10.  Gunnar Wennerberg (7 out of 7 patents)

11.  Pekka M Typpo (5 out of 25 patents)

12.  Philip M Hegland (5 out of 7 patents)

13.  Anthony D Foskett (5 out of 5 patents)

14.  Mark J Alguard (5 out of 6 patents)

15.  Tobias J Boissevain (4 out of 4 patents)


Core Competencies:
Moisture Control
Sensor Systems
Surface Measurement
Sheet Formation
Caliper Gauge
Nuclear Gauge
Optical Alignment
Fiber Orientation
Coating Weight
Actuator Controller
Paper Strength
Temperature Sensor

147 patents:

Company Overview
Measurex Corporation, based in Cupertino, CA, specializes in advanced sheetmaking technology, focusing on enhancing manufacturing processes in various industries. The company is renowned for its expertise in moisture control, sensor systems, and surface measurement, which are critical for optimizing sheet formation and ensuring product quality. Their innovative solutions include caliper gauges, nuclear gauges, and optical alignment technologies, all designed to improve fiber orientation and overall production efficiency.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

147 Patents

#3 in Cupertino, CA

#590 in California

#2,674 in US

#5,559 in the World

Cupertino, CA (US)
Cupertino, CA, United States of America
Forward Citations = 2,740

93 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Measurex Corporation. Retrieved from https://idiyas.com/company/measurex

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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