The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1994
Filed:
Nov. 04, 1991
Applicant:
Inventors:
Leonard M Anderson, San Jose, CA (US);
John J Howarth, Scotts Valley, CA (US);
Assignee:
Measurex Corporation, Cupertino, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05C / ;
U.S. Cl.
CPC ...
118689 ; 118688 ; 118419 ; 118413 ;
Abstract
The present invention relates to apparatuses and methods for measuring and controlling the amount of multiple coating materials applied to a substrate, and in particular to an apparatus and method for monitoring and regulating the amount of multiple coating materials containing different compositions applied to a substrate, such as paperboard. The coating measurement is insensitive to changes in both the amount of substrate as well as in the amount of an interfering component associated with the substrate.