% Expired Patents = 20.0

EPO Patents = 1

Forward Citations = 80

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8 inventors (with patents filed for the assignee):

Roman Z Morawski (4 out of 5 patents)

Andrzej Barwicz (4 out of 5 patents)

Mohamed B Slima (3 out of 3 patents)

4. Andrzej Miekina (2 out of 3 patents)

5. Stephen William Roberts (1 out of 34 patents)

6. Andrzcj Barwicz (1 out of 1 patent)

7. Sebastien Lesueur (1 out of 1 patent)

8. Tomasz Oleszczak (1 out of 1 patent)

9. Tomasz Olesczak (0 patent)

5 patents: Sort by Forward Citations

1. 7315370 - Flash optical performance monitor (2008-01-01),

2. 7084974 - Apparatus and method for light spectrum measurement (2006-08-01),

3. 6510257 - Multi-wavelength polarization monitor for use in fibre optic networks (2003-01-21),

4. 6002479 - Apparatus and method for light spectrum measurement (1999-12-14),

5. 5991023 - Method of interpreting spectrometric data (1999-11-23),

Company Overview

Measurement Microsystems A-Z Inc. is a leading provider of measurement and control solutions for various industries. With a strong focus on innovation and technology, we offer a wide range of cutting-edge products and services to help our customers improve efficiency and productivity. Our team of experts is committed to delivering high-quality solutions that meet the unique needs of each client. Visit our website to learn more about our offerings and how we can help you achieve your goals.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

5 Patents

#1 in Trois-Rivieres

#2,850 in Canada

Trois-Rivieres, Canada

Measurement Microsystems A-Z Inc.

Forward Citations = 80

8 inventors:

Roman Z Morawski (4 out of 5 patents)

Andrzej Barwicz (4 out of 5 patents)

Mohamed B Slima (3 out of 3 patents)

4. Andrzej Miekina (2 out of 3 patents)

5. Stephen William Roberts (1 out of 34 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Measurement Microsystems A-Z Inc.. Retrieved from https://idiyas.com/company/measurement-microsystems-a-z

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]