The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1999
Filed:
May. 19, 1998
Applicant:
Inventors:
Roman Z Morawski, Warsaw, PL;
Andrzej Barwicz, Trois-Rivieres, CA;
Mohamed B Slima, Trois-Rivieres, CA;
Andrzej Miekina, Warsaw, PL;
Assignee:
Measurement Microsystems A-Z Inc., Trois-Rivieres, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356326 ;
Abstract
A method for spectral measurement is disclosed. The method uses a low-resolution grating to disperse light and thereby image a spectrum thereof. The imaged spectrum is converted into a digital electrical signal and is processed in order to enhance the spectral information. The resulting spectral information is analogous to that captured using a higher resolution spectral imager with optical processing of the spectral data. The method is equally applicable to enhancing resolution of spectra captured using high resolution spectral imaging devices.