Lexington, MA, United States of America

Lockheed Martin Ir Imaging Systems, Inc.

USPTO Granted Patents = 10

Forward Citations = 317

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11 inventors (with patents filed for the assignee):

goldMedal Neal R Butler (7 out of 45 patents)

silverMedal Charles McAlister Marshall (4 out of 33 patents)

bronzeMedal Richard Blackwell (3 out of 6 patents)

4.  Robert D Frey, Jr (1 out of 23 patents)

5.  Curtis A Vock (1 out of 106 patents)

6.  Marcus Hatch (1 out of 3 patents)

7.  Michael A Martinelli (1 out of 20 patents)

8.  Kenneth R Erikson (1 out of 20 patents)

9.  Wayne C Haase (1 out of 18 patents)

10.  Timothy E White (1 out of 10 patents)

11.  Jacek Mroczkowski (1 out of 2 patents)


10 patents:

Company Overview
Lockheed Martin Ir Imaging Systems, Inc., based in Lexington, MA, specializes in advanced infrared imaging technologies. The company focuses on developing and manufacturing high-performance thermal imaging systems that are utilized in various defense and security applications. Their expertise encompasses a range of domains, including aerospace, defense, and surveillance, contributing to enhanced situational awareness and operational effectiveness for military and civilian users alike. Lockheed Martin's commitment to innovation positions it as a leader in the infrared imaging sector.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

10 Patents

#65 in Lexington, MA

#1,773 in Massachusetts

#29,882 in US

#56,092 in the World

Lexington, MA (US)
Lexington, MA, United States of America
Forward Citations = 317

11 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Lockheed Martin Ir Imaging Systems, Inc.. Retrieved from https://idiyas.com/company/lockheed-martin-ir-imaging-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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