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USPTO Data Jan 1 1976 - Oct 13 2026
4 Patents
#211 in D-1000 Berlin
#7,035 in Germany
L.u.m. Gmbh
Forward Citations = 55
10 inventors:
L.u.m. Gmbh
% Expired Patents = 50.0
EPO Patents = 3
Trademarks = 2
Forward Citations = 55
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10 inventors (with patents filed for the assignee):
Dietmar Lerche (3 out of 5 patents)
Gert Sinn (1 out of 5 patents)
Klaus-Henrik Mittenzwey (1 out of 4 patents)
4. Rudolf Ehwald (1 out of 15 patents)
5. Titus Sobisch (1 out of 2 patents)
6. Torsten Detloff (1 out of 2 patents)
7. Frank Babick (1 out of 2 patents)
8. Michael Stintz (1 out of 2 patents)
9. Uwe Mertens (1 out of 1 patent)
10. Holger Woehlecke (1 out of 2 patents)
11. Heinz Lichtenfeld (0 patent)
12. Martin Hussels (0 patent)
13. Elia Wollik (0 patent)
14. Martin Holke (0 patent)
15. Markus Wolff (0 patent)
4 patents:
Company Overview
L.u.m. GmbH is a leading provider of innovative measurement technology for particle characterization. With a focus on dynamic light scattering and laser diffraction, L.u.m. GmbH offers high-quality instruments for pharmaceutical, food, and chemical industries. The company's solutions enable accurate and reliable particle analysis for research and quality control purposes.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: L.u.m. Gmbh. Retrieved from https://idiyas.com/company/l-u-m
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]