The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Aug. 02, 2012
Applicants:

Dietmar Lerche, Berlin, DE;

Titus Sobisch, Berlin, DE;

Torsten Detloff, Güstrow, DE;

Frank Babick, Dresden, DE;

Michael Stintz, Dresden, DE;

Inventors:

Dietmar Lerche, Berlin, DE;

Titus Sobisch, Berlin, DE;

Torsten Detloff, Güstrow, DE;

Frank Babick, Dresden, DE;

Michael Stintz, Dresden, DE;

Assignee:

L.U.M. GmbH, Berlin, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 15/02 (2006.01); G01N 15/04 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 15/042 (2013.01);
Abstract

A method and a device for the automatic determination of selected physical and colloidal chemistry parameters by determining the attenuation of radiated waves through monodisperse or polydisperse dispersion samples subjected to gravitation or centrifugation, wherein during the segregation by means of centrifugation or gravitation, the instantaneous transmission I(t, r) characterizing the current segregation status of the waves radiated with the intensity I(t, r) and/or the instantaneous scattering I(t, r) as a function of the position within the samples is repeatedly determined and recorded at high resolution at any arbitrary time for one or more wavelengths over the entire length of the sample or in selected partial sections of it, simultaneously for multiple and even concentrated samples with known and/or unknown physical and colloidal chemistry properties.


Find Patent Forward Citations

Lerche, Dietmar. (2015). Method and device for the characterization of multiple samples of one or various dispersions (U.S. Patent No. 9019493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9019493

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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