Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
9 Patents
#24 in Edison, NJ
#1,223 in New Jersey
#32,605 in US
Jobin Yvon, Inc.
Forward Citations = 251
14 inventors:
Edison, NJ, United States of America
Jobin Yvon, Inc.
% Expired Patents = 11.1
Trademarks = 10
Forward Citations = 251
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14 inventors (with patents filed for the assignee):
Nicolas Vezard (2 out of 2 patents)
Ming Xiao (2 out of 2 patents)
Guy Pieuchard (2 out of 2 patents)
4. Adam Matthew Gilmore (1 out of 7 patents)
5. James R Mattheis (1 out of 1 patent)
6. Warren Stephen Slutter (1 out of 5 patents)
7. Gregoire Verrier (1 out of 1 patent)
8. Kevin Lange (1 out of 1 patent)
9. Wu Jiang (1 out of 2 patents)
10. Nicolas Vezard (1 out of 4 patents)
11. Jean Pierre Laude (1 out of 1 patent)
12. Jean Flamand (1 out of 4 patents)
13. Genevieve Passereau (1 out of 3 patents)
14. Gregoire Verrier (1 out of 1 patent)
9 patents:
Company Overview
Jobin Yvon, Inc. specializes in manufacturing high-performance spectroscopy instruments and solutions for research and industrial applications. With a history dating back to 1819, Jobin Yvon has built a reputation for quality and innovation in the field of optical and spectroscopic technology. The company's products include spectrometers, monochromators, and imaging systems, all designed to meet the diverse needs of customers in various industries such as pharmaceuticals, materials science, and environmental monitoring.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Jobin Yvon, Inc.. Retrieved from https://idiyas.com/company/jobin-yvon
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]