The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Apr. 25, 2005
Applicants:

Adam M. Gilmore, Flemington, NJ (US);

James R. Mattheis, East Brunswick, NJ (US);

Inventors:

Adam M. Gilmore, Flemington, NJ (US);

James R. Mattheis, East Brunswick, NJ (US);

Assignee:

Jobin Yvon, Inc., Edison, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for identification of a sample of a material is disclosed. The method includes illuminating a sample at a plurality of excitation wavelengths, measuring the intensity at each of the plurality of excitation wavelengths, locating the values of maxima in the three-dimensional intensity contour, comparing the maxima to a library of values of known maxima associated with known species, generating a model of a three-dimensional intensity contour based on maxima values comprising values of likely maxima from the library, comparing the model of an intensity contour to the measured contour to determine residual errors, outputting the species associated with the maxima values used to generate the model as an indicator of species, determining corrections to the model of a three-dimensional intensity contour to generate a corrected model, and returning to the comparison step to test the corrected model.


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