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Jenoptik Jena G.m.b.h.

USPTO Granted Patents = 77

Forward Citations = 705

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174 inventors (with patents filed for the assignee):

Joachim Mohr (4 out of 4 patents)

Helmut Becker-Ross (4 out of 5 patents)

Ludwig Meier (4 out of 4 patents)

4. Peter Hentschel (4 out of 4 patents)

5. Wolfgang Meyl (4 out of 4 patents)

6. Thomas Furche (3 out of 4 patents)

7. Thomas Schwarz (3 out of 4 patents)

8. Wolfgang Schutt (3 out of 3 patents)

9. Winfried Quillfeldt (3 out of 3 patents)

10. Gebhard Kuhn (3 out of 4 patents)

11. Wieland Feist (3 out of 3 patents)

12. Ulrich Zeth (3 out of 3 patents)

13. Felix Kerstan (2 out of 2 patents)

14. Stefan Florek (2 out of 3 patents)

15. Joachim Bergner (2 out of 2 patents)

Core Competencies:

Optical Systems

Illumination Equipment

Spectral Analysis

Photogrammetry

Microscope Stand

Geodetic Instrument

Laser Spectral Fluorometer

Particle Irradiation

Electrothermal Atomization

Angle Measuring Device

Emission Spectral Analysis

Adjustable Echelle Spectrometer

77 patents: Sort by Forward Citations

1. 5206710 - Method and apparatus for thermowave analysis (1993-04-27),

2. 5180127 - Device for adjustably setting up an aerial photograph measuring chamber (1993-01-19),

3. 5136429 - Modular illumination equipment (1992-08-04),

4. 5127614 - Microscope stand (1992-07-07),

5. 5094727 - Electrolyte for producing conversion coatings (1992-03-10),

6. 5075178 - Black surface layer on light metal (1991-12-24),

7. 5056901 - Wide-angle objective (1991-10-15),

8. 5035781 - Electrolyte for the production of black surface layers on light metals (1991-07-30),

9. 5006981 - System bus expansion for coupling multimaster-capable multicomputer (1991-04-09),

10. 4979823 - Method and arrangement for background compensation in material analysis (1990-12-25),

11. 4930878 - Achromatic phase retarder arrangement (1990-06-05),

12. 4900149 - Method for the simultaneous analysis of several elements (1990-02-13),

13. 4879684 - Write-read circuit (1989-11-07),

14. 4869590 - Geodetic instrument (1989-09-26),

15. 4856898 - Adjustable echelle spectrometer arrangement and method for its adjustment (1989-08-15),

Jenoptik Jena G.m.b.h. is a prominent player in the field of optical systems, specializing in the development and manufacturing of advanced illumination equipment, spectral analysis tools, and photogrammetry solutions. The company is recognized for its innovative contributions to geodetic instruments and laser spectral fluorometers, catering to a diverse range of applications including scientific research and industrial processes. Based in Jena, Germany, Jenoptik combines expertise in optics and precision engineering to deliver high-quality products that meet the evolving needs of its global clientele.

Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Sep 29 2026

Jenoptik Jena G.m.b.h.

77 Patents

#6 in Jena

#745 in Germany

#9,755 in the World

Jenoptik Jena G.m.b.h.

Forward Citations = 705

174 inventors:

Joachim Mohr (4 out of 4 patents)

Helmut Becker-Ross (4 out of 5 patents)

Ludwig Meier (4 out of 4 patents)

4. Peter Hentschel (4 out of 4 patents)

5. Wolfgang Meyl (4 out of 4 patents)

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