The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 1993

Filed:

Sep. 25, 1991
Applicant:
Inventors:

Hans-Dieter Geiler, Jena, DD;

Matthias Wagner, Jena, DD;

Peter Kowalski, Jena, DD;

Assignee:

Jenoptik Jena GmbH, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356432 ; 356447 ;
Abstract

A method and apparatus for thermowave analysis employs a single laser beam, which has an additive, two-frequency, intensity modulation, and is directed onto the object. The amplitude of the mixed frequency of the discrete modulation frequencies, which is not contained in the exciting beam, is analyzed as response signal. By obtaining a reference signal from the exciting beam and forming the difference between this exciting beam and the measurement signal, noise suppression and a lowering of the limit of sensitivity are achieved in an advantageous manner.


Find Patent Forward Citations

Loading…