Forward Citations = 150

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9 inventors (with patents filed for the assignee):

John C Webber (3 out of 6 patents)

Curtis A Knight (2 out of 4 patents)

John E Effland (1 out of 3 patents)

4. John M Gipson (1 out of 2 patents)

5. David B Shaffer (1 out of 2 patents)

6. Ray E Poff (1 out of 1 patent)

7. James G Czechanski (1 out of 1 patent)

8. Anne Nelson (1 out of 1 patent)

9. Rene F Larriva (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 5594452 - Method and system for locating an unknown transmitter using calibrated (1997-01-14),

2. 5570096 - Method and system for tracking satellites to locate unknown transmitting (1996-10-29),

3. 5377935 - Spacecraft ceramic protective shield (1995-01-03),

4. 5008679 - Method and system for locating an unknown transmitter (1991-04-16),

Company Overview

Interferometrics Incorporated is a leading provider of advanced optical measurement solutions for the aerospace and defense industries. Our innovative technology allows for precise measurements of complex optical systems, enabling our customers to achieve unparalleled accuracy in their operations. With over a decade of experience, we continue to push the boundaries of optical metrology to deliver cutting-edge solutions to our clients.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

4 Patents

#36 in Vienna, VA

#1,103 in Virginia

#60,641 in US

Vienna, VA, United States of America

Interferometrics Incorporated

Forward Citations = 150

9 inventors:

John C Webber (3 out of 6 patents)

Curtis A Knight (2 out of 4 patents)

John E Effland (1 out of 3 patents)

4. John M Gipson (1 out of 2 patents)

5. David B Shaffer (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Interferometrics Incorporated. Retrieved from https://idiyas.com/company/interferometrics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]