Chandler, AZ, United States of America

Instrumentation Metrics, Inc.

Calculating rank
USPTO Granted Patents = 15

% Expired Patents = 6.7

Forward Citations = 5,303

Loading Chart...
Loading Chart...

25 inventors (with patents filed for the assignee):

goldMedal Stephen F Malin (9 out of 11 patents)

silverMedal Timothy Lewis Ruchti (7 out of 107 patents)

bronzeMedal Thomas B Blank (4 out of 40 patents)

4.  Gamal Khalil (4 out of 6 patents)

5.  Kevin H Hazen (3 out of 45 patents)

6.  Stephen L Monfre (3 out of 30 patents)

7.  George M Acosta (3 out of 20 patents)

8.  Jessica Rennert (3 out of 7 patents)

9.  Mutua Mattu (2 out of 10 patents)

10.  Suresh Thennadil (2 out of 7 patents)

11.  Glenn Aaron Kees (2 out of 4 patents)

12.  Marcy R Makarewicz (2 out of 9 patents)

13.  Frank S Grochocki (2 out of 3 patents)

14.  Timothy Stippick (1 out of 7 patents)

15.  Kenneth J Schlager (1 out of 11 patents)


15 patents:

Company Overview
Instrumentation Metrics, Inc. is a technology company based in Chandler, AZ, specializing in advanced measurement and monitoring solutions. The organization focuses on developing innovative instrumentation technologies that enhance data collection and analysis across various industries. With a commitment to precision and reliability, Instrumentation Metrics serves sectors such as aerospace, automotive, and manufacturing, providing tools that facilitate improved operational efficiency and decision-making through accurate metrics and insights.
Profile summary synthesized from public USPTO records and patent filings.

logo

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

15 Patents

#29 in Chandler, AZ

#258 in Arizona

#21,085 in US

#39,991 in the World

Chandler, AZ (US)
Chandler, AZ, United States of America
Forward Citations = 5,303

25 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Instrumentation Metrics, Inc.. Retrieved from https://idiyas.com/company/instrumentation-metrics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…