The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 1999

Filed:

Jan. 28, 1998
Applicant:
Inventors:

Gamal Khalil, Chandler, AZ (US);

Stephen F Malin, Chanhassen, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
25033912 ; 25033909 ; 25033911 ; 2503418 ;
Abstract

An apparatus is provided for determining the concentration of an analyte present in a sample using multi-spectral analysis in the near-infrared (NIR) range. Incident radiation containing a plurality of distinct, nonoverlapping spectral regions of wavelengths in the near-infrared range is used to irradiate the sample. Diffusively reflected radiation emerging from the sample is detected, and a value indicative of the concentration of the analyte is obtained therefrom, preferably using an application of chemometrics techniques. Information obtained from each of the nonoverlapping spectral regions of wavelengths can be cross-correlated to remove background interference.


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