Inray Ltd.

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USPTO Granted Patents = 4

Forward Citations = 103

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2 inventors (with patents filed for the assignee):

Jacob Rubinstein (4 out of 8 patents)

Gershon Moshe Wolansky (4 out of 6 patents)

4 patents: Sort by Forward Citations

1. 6755524 - Ophthalmic optical elements and methods for the design thereof (2004-06-29),

2. 6661523 - Method for determining and designing optical elements (2003-12-09),

3. 6655803 - Wavefront method for designing optical elements (2003-12-02),

4. 6256098 - Method for determining and designing optical elements (2001-07-03),

Company Overview

Inray Ltd. is a leading provider of innovative X-ray inspection solutions for a wide range of industries. With over 20 years of experience in the field, our cutting-edge technology ensures the highest level of quality control, security, and efficiency for our clients. From food and pharmaceuticals to automotive and electronics, Inray Ltd. offers bespoke solutions tailored to meet the specific needs of each industry. Our commitment to excellence and customer satisfaction sets us apart as a trusted partner in inspection technology.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

4 Patents

#2 in Upper Galilee

#1,417 in Israel

Upper Galilee, Israel

Inray Ltd.

Forward Citations = 103

2 inventors:

Jacob Rubinstein (4 out of 8 patents)

Gershon Moshe Wolansky (4 out of 6 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Inray Ltd.. Retrieved from https://idiyas.com/company/inray

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]