The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2003

Filed:

Jun. 14, 1999
Applicant:
Inventors:

Jacob Rubinstein, Misgav, IL;

Gershon Moshe Wolansky, Jerusalem, IL;

Assignee:

Inray Ltd., Upper Galilee, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract

A method for determining or designing the topography of at least one unknown surface of an optical element includes the steps of measuring or prescribing geometrical properties, determining a set of integration equations from the geometrical properties, and determining the topography of the at least one unknown surface from the set of equations. The set of integration equations is determined also from the optical index or indexes of the optical element. The geometrical properties measured or prescribed are the geometric properties of a plurality of rays incident upon the optical element and of a corresponding plurality of rays affected by at least the at least one unknown surface.


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