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Forward Citations = 48

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8 inventors (with patents filed for the assignee):

David S Kurtz (6 out of 11 patents)

Paul R Moran (5 out of 6 patents)

Krzysztof J Kozaczek (4 out of 4 patents)

4. Roger Isaac Martin (3 out of 6 patents)

5. Kenneth Parker Rodbell (2 out of 137 patents)

6. Sandra Guy Malhotra (2 out of 113 patents)

7. Patrick W Dehaven (2 out of 3 patents)

8. Kryzsztof J Kozaczek (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 6909772 - Method and apparatus for thin film thickness mapping (2005-06-21),

2. 6882739 - Method and apparatus for rapid grain size analysis of polycrystalline materials (2005-04-19),

3. 6792075 - Method and apparatus for thin film thickness mapping (2004-09-14),

4. 6678347 - Method and apparatus for quantitative phase analysis of textured polycrystalline materials (2004-01-13),

5. 6301330 - Apparatus and method for texture analysis on semiconductor wafers (2001-10-09),

6. 6058160 - Photo-sensor fiber-optic stress analysis system (2000-05-02),

Hypernex, Inc. is a leading technology company specializing in data management solutions. With expertise in data analytics, cloud computing, and cybersecurity, Hypernex helps businesses leverage their data for strategic decision-making and improved performance. Their innovative solutions are trusted by companies across various industries to optimize their data infrastructure and drive business growth.

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USPTO Data Jan 1 1976 - Dec 9 2025

6 Patents

#18 in State College, PA

#1,593 in Pennsylvania

#43,750 in US

State College, PA, United States of America

Hypernex, Inc.