The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jul. 26, 2002
Applicant:
Inventors:
Krzysztof J. Kozaczek, State College, PA (US);
David S. Kurtz, State College, PA (US);
Paul R. Moran, Port Matilda, PA (US);
Roger I. Martin, State College, PA (US);
Assignee:
HyperNex, Inc., State College, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/3207 ;
U.S. Cl.
CPC ...
G01N 2/3207 ;
Abstract
A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically eliminated from such corrected and integrated x-ray diffraction intensities, based on the texture information obtained from the sample mixture.
Quick Actions:
Kozaczek, Krzysztof. (2004). Method and apparatus for quantitative phase analysis of textured polycrystalline materials (U.S. Patent No. 6678347). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6678347
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile