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USPTO Data Jan 1 1976 - Oct 27 2026
7 Patents
#3 in San Juan
#16 in Puerto Rico
Hoyos Integrity Corporation
Forward Citations = 38
16 inventors:
Hoyos Integrity Corporation
Calculating rank
% Expired Patents = 85.7
Forward Citations = 38
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16 inventors (with patents filed for the assignee):
John Shemelynce (3 out of 6 patents)
Patricio Durazo (3 out of 4 patents)
Amit Verma (3 out of 21 patents)
4. Gary J Peterson (3 out of 20 patents)
5. William H Robertson, Jr (3 out of 88 patents)
6. Gustavo Dario Leizerovich (2 out of 53 patents)
7. Julio A Abdala (2 out of 24 patents)
8. Guillermo Padin, Jr (2 out of 5 patents)
9. Moises De La Cruz (2 out of 7 patents)
10. Tal Mor (1 out of 14 patents)
11. Hector Hoyos (1 out of 45 patents)
12. Biren Patel (1 out of 4 patents)
13. Hao Nguyen (1 out of 4 patents)
14. Claudio Santiago Ribeiro (1 out of 126 patents)
15. Peter Aloumanis (1 out of 10 patents)
7 patents:
Company Overview
Hoyos Integrity Corporation is a leading provider of advanced biometric identity authentication and cybersecurity solutions. With a focus on secure digital transactions and data protection, the company leverages cutting-edge technology to help businesses and governments protect critical information and assets. Hoyos Integrity Corporation is committed to delivering innovative solutions that enhance security and streamline operations.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hoyos Integrity Corporation. Retrieved from https://idiyas.com/company/hoyos-integrity
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]