Rapperswil, Switzerland

Graf + Cie Ag


USPTO Granted Patents = 35

% Expired Patents = 25.7


Trademarks = 3

Forward Citations = 117

Loading Chart...
Loading Chart...

21 inventors (with patents filed for the assignee):

goldMedal Ralph A Graf (22 out of 31 patents)

silverMedal Urs Müller (3 out of 3 patents)

bronzeMedal Werner Bisquolm (3 out of 3 patents)

4.  Peter Artzt (2 out of 53 patents)

5.  Günter Steinbach (2 out of 2 patents)

6.  Volker Jehle (2 out of 6 patents)

7.  Arnold Vetterli (2 out of 2 patents)

8.  Markus Schilter (2 out of 2 patents)

9.  Urs Schiltknecht (2 out of 2 patents)

10.  Stefan Geisser (2 out of 2 patents)

11.  Willy Grob (1 out of 1 patent)

12.  Josef Iten (1 out of 1 patent)

13.  Felix Hasler (1 out of 1 patent)

14.  Nikolaos Pavlou (1 out of 1 patent)

15.  Erwin Zurcher (1 out of 13 patents)


Core Competencies:
Clothing Carrier
Fastening Device
Sawtooth Clothing
Textile Machine
Carding Machines
Fiber Processing
Circular Comb
Combing Element
Wire Manufacturing
Dirt Separator
Textile Fibers
Card Flat

35 patents:

Company Overview
Graf + Cie AG, headquartered in Rapperswil, Switzerland, specializes in the development and manufacturing of high-quality textile machinery and components. The company is recognized for its innovative solutions in the textile industry, focusing on enhancing production efficiency and product quality. With a commitment to research and development, Graf + Cie AG continually advances its technology offerings, catering to a global market and contributing to the evolution of textile manufacturing processes.
Profile summary synthesized from public USPTO records and patent filings.

logo

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

35 Patents

#1 in Rapperswil

#397 in Switzerland

#19,148 in the World

Rapperswil, CH
Rapperswil, Switzerland
Forward Citations = 117

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Graf + Cie Ag. Retrieved from https://idiyas.com/company/graf-plus-cie-ag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…