logo

For the Inventor, By the Inventor

JP

Giga Probe, Inc.


USPTO Granted Patents = 3

Forward Citations = 51

Loading Chart...
Loading Chart...

4 inventors (with patents filed for the assignee):

goldMedal Kaoru Sato (3 out of 7 patents)

silverMedal Yutaka Okumura (3 out of 3 patents)

bronzeMedal Miyoshi Okumura (2 out of 2 patents)

4.  Harunobu Ikeuchi (2 out of 2 patents)


3 patents:

1. 5355080 - Multi-point probe assembly for testing electronic device (1994-10-11),
2. 5214375 - Multi-point probe assembly for testing electronic device (1993-05-25),
3. 5084672 - Multi-point probe assembly for testing electronic device (1992-01-28),
logo

Company Badge

USPTO Data Jan 1 1976 - Jan 13 2026

3 Patents

#454 in

#8,772 in Japan

...
JP

Giga Probe, Inc.

Forward Citations = 51

4 inventors:

goldMedal Kaoru Sato (3 out of 7 patents)

silverMedal Yutaka Okumura (3 out of 3 patents)

bronzeMedal Miyoshi Okumura (2 out of 2 patents)

4.  Harunobu Ikeuchi (2 out of 2 patents)

Please report any incorrect information to support@idiyas.com
Loading…