The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 1993
Filed:
Mar. 26, 1992
Harunobu Ikeuchi, Tokyo, JP;
Miyoshi Okumura, Kanagawa, JP;
Kaoru Sato, Tokyo, JP;
Yutaka Okumura, Kanagawa, JP;
Giga Probe, Inc., Kanagawa, JP;
Abstract
A test probe assembly including a plurality of electrically conductive probe arms each of which is secured to a substrate and electrically coupled to one of electrically conductive lines provided on the substrate. An intermediate portion of the arm is arranged to be resiliently deformable when a probe point which extends therefrom comes into contact with a terminal of the electronic device under test. A guide is provided on the structure on which the arms are mounted, for guiding the probe point so that movement other than reciprocation is either prevented or arrested. The resilient portion is arranged with respect to the probe point so that generation of motion other than reciprocation of the probe point is attenuated.