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For the Inventor, By the Inventor

Kanagawa, Japan

Fujitsu Semicondoctor Limited


USPTO Granted Patents = 1

Forward Citations = 1

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2 inventors (with patents filed for the assignee):

goldMedal Yasuyuki Nozuyama (1 out of 39 patents)

silverMedal Atsuo Takatori (1 out of 3 patents)


1 patent:

1. 8051403 - Delay fault test quality calculation apparatus, delay fault test quality calculation method, and delay fault test pattern generation apparatus (2011-11-01),
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USPTO Data Jan 1 1976 - Dec 16 2025

1 Patents

#472 in Kanagawa

#15,539 in Japan

...
Kanagawa, Japan

Fujitsu Semicondoctor Limited

Forward Citations = 1

2 inventors:

goldMedal Yasuyuki Nozuyama (1 out of 39 patents)

silverMedal Atsuo Takatori (1 out of 3 patents)

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