Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
6 Patents
#23 in Chelmsford, MA
#2,546 in Massachusetts
#45,007 in US
First Light Diagnostics, Inc.
Forward Citations = 1
12 inventors:
Chelmsford, MA, United States of America
First Light Diagnostics, Inc.
Calculating rank
EPO Patents = 1
Trademarks = 6
Forward Citations = 1
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12 inventors (with patents filed for the assignee):
Don Straus (6 out of 15 patents)
Greg Yantz (2 out of 4 patents)
Gordon Siek (1 out of 6 patents)
4. Bruce Walsh (1 out of 4 patents)
5. Brian Connolly (1 out of 1 patent)
6. Matthew Barra (1 out of 1 patent)
7. Boris Blanter (1 out of 1 patent)
8. Paul Gervasio (1 out of 1 patent)
9. Damon Dehart (1 out of 1 patent)
10. Michael Cappillino (1 out of 1 patent)
11. Sadanand Gite (1 out of 1 patent)
12. Jayson L Bowers (1 out of 1 patent)
6 patents:
Company Overview
First Light Diagnostics, Inc. is a biotechnology company focused on developing innovative diagnostic solutions for infectious diseases. Their proprietary technology aims to provide rapid and accurate results, enhancing patient care and treatment decisions. The company is dedicated to addressing unmet medical needs through advanced diagnostics, leveraging cutting-edge research and development to improve healthcare outcomes.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: First Light Diagnostics, Inc.. Retrieved from https://idiyas.com/company/first-light-diagnostics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]